Last edited by Samugor
Wednesday, August 12, 2020 | History

3 edition of design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control found in the catalog.

design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control

Loren W. Linholm

design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control

by Loren W. Linholm

  • 85 Want to read
  • 19 Currently reading

Published by U.S. Dept. of Commerce, National Bureau of Standards, For sale by the Supt. of Docs., U.S. G.P.O. in Washington, D.C .
Written in English

    Subjects:
  • Integrated circuits -- Testing.

  • Edition Notes

    StatementLoren W. Linholm ; sponsored by U.S. Air Force ... [et al.].
    SeriesNBS special publication ;, 400-66, Semiconductor measurement technology
    ContributionsUnited States. National Engineering Laboratory. Electron Devices Division., United States. National Bureau of Standards.
    Classifications
    LC ClassificationsQC100 .U57 no. 400-66, TK7874 .U57 no. 400-66
    The Physical Object
    Paginationv, 142 p. :
    Number of Pages142
    ID Numbers
    Open LibraryOL3919214M
    LC Control Number81600078


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Design, testing, and analysis of a comprehensive test pattern for measuring CMOS/SOS process performance and control by Loren W. Linholm Download PDF EPUB FB2